Scientific journal NRU ITMO
Series "Economics and Environmental Management"
Registration certificate ЭЛ № ФС 77 – 55411 от 17.09.2013
зарегистрировано в Федеральной службе по надзору в сфере связи, информационных технологий и массовых коммуникаций
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June (published: )

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Home > Issue > OPTICAL FIELD AMPLITUDE DISTRIBUTION ON THE PATTERN PLATE OF OPTOELECTRONIC SYSTEM FOR MEASURING OF DITHER SYSTEM PARAMETERS IN RING LASER GYRO

OPTICAL FIELD AMPLITUDE DISTRIBUTION ON THE PATTERN PLATE OF OPTOELECTRONIC SYSTEM FOR MEASURING OF DITHER SYSTEM PARAMETERS IN RING LASER GYRO


Subject of Research.We study the optoelectronic system that measures vibration parameters of dither system in a ring laser gyro and serves for compensation of these oscillations. The paper considers the process of laser radiation passing through the system elements and the optical field amplitude distribution on its pattern plate. The amplitude distribution is analyzed for a small linear shift and a small tilt of the lens. Methods. We used the elements of the field calculation methodology in optical systems for information reading and writing from digital disks. Primary laser radiation parameters are determined from passport characteristics of the radiation source. The radiation transformation made by the system optical elements was evaluated by ray tracing using ray packets. The optical field amplitude distribution on pattern plate was calculated by diffraction integral with aberrations. Main Results. It is shown that the amplitude distribution is typical for diffraction limited optical system with aberrations. Simulation results give the possibility to discover that the dependences of this distribution on the shift and tilt of the lens are linear. Practical Relevance. The optoelectronic system can measure vibration parameters of dither system in real time with small errors and enables the increase of ring laser gyro accuracy.Analysis and calculation of the optical field amplitude distribution on its pattern plate is one of developing stages of the mathematical model for optoelectronic system. In future this model will be applicable for performing a detailed error analysis of the system and exploring its operation.

Keywords: laser gyro, ring laser, dither system, optoelectronic measuring system, optical field, aberrations, diffraction

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